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Geological Survey of Canada
Geological Survey of Canada


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Natural Resources Canada > Earth Sciences Sector > Geological Survey of Canada > Services > Electron Beam Laboratory
Electron Beam Laboratory
Scanning electronic microscope (SEM)

The scanning electron microscopy laboratory is equipped with a Cambridge S-360 scanning electron microscopes, with an Oxford Link Analytical eXL-II integrated energy dispersive spectrometers (EDS). Our second SEM is a Cambridge S200 with a EDS system.

Cambridge Instruments S200 scanning electron microscope and EDS S200 Lab: Cambridge Instruments S200 scanning electron microscope and EDS
Leica Cambridge Stereoscan S360 with a fully integrated Oxford Instruments (Link) eXL-II energy dispersive analyzer (image courtesy Cambridge Instruments) S360 Lab: Leica Cambridge Stereoscan S360 with a fully integrated Oxford Instruments (Link) eXL-II energy dispersive analyzer (image courtesy Cambridge Instruments)

Some highlights of the SEM instrumentation at the GSC:

  • Configured to produce conventional topographic (secondary electron) and atomic number contrast (backscattered electron) and cathodoluminescence (CL) images.

  • EDS systems are fully integrated with their respective SEM for electron beam and stage automation.

  • In addition to the conventional x-ray analysis capabilities, the EDS systems are used to produce high resolution digital elemental distribution maps.

  • Automated image analysis is one of the major strengths of the EDS systems, allowing combined physical measurements and chemical classification in an unattended operation.

  • Images from the SEM are captured digitally and transferred to a PC or MAC where they can be saved in any format for further processsing, or printed on a laser or inkjet printer.

Facility Access

The Electron Beam Laboratory is available for use by all GSC headquarters and district scientific staff. Other federal government scientific staff and individuals from external bodies may access the facility under special terms and agreements.

2006-09-10Important notices